Moises Padilla

Moises Padilla
Are you Moises Padilla?

Claim your profile, edit publications, add additional information:

Contact Details

Name
Moises Padilla
Affiliation
Location

Pubs By Year

Pub Categories

 
Physics - Optics (4)
 
Physics - Instrumentation and Detectors (1)

Publications Authored By Moises Padilla

Fringe-projection profilometry with 1 camera and 1 fringe-projector is a well-known and widely used technique in optical metrology. Spatial-frequency multiplexing interferometry with several spatial-carriers having non-overlapping spatial-spectra is also well known and productive in optical metrology. In this paper we propose temporal-multiplexing phase-shifting interferometry applied to profilometry. Read More

In this paper we apply the frequency transfer function (FTF) formalism to analyze the red, green and blue (RGB) phase-shifting fringe-projection profilometry technique. The phase-shifted fringe patterns in RGB fringe projection are typically corrupted by crosstalk because the sensitivity curves of most projection-recording systems overlap. Crosstalk distortion needs to be compensated in order to obtain high quality measurements. Read More

Synthesis of single-wavelength temporal phase-shifting algorithms (PSA) for interferometry is well-known and firmly based on the frequency transfer function (FTF) paradigm. Here we extend the single-wavelength FTF-theory to dual and multi-wavelength PSA-synthesis when several simultaneous laser-colors are present. The FTF-based synthesis for dual-wavelength PSA (DW-PSA) is optimized for high signal-to-noise ratio and minimum number of temporal phase-shifted interferograms. Read More

360-degrees digitalization of three-dimensional (3D) solids using a projected light-strip is a well established technique. These profilometers project a light-strip over the solid under analysis while the solid is rotated a full revolution. Then a computer program typically extracts the centroid of this light-strip, and by triangulation one obtains the shape of the solid. Read More